Bright-field imaging
Rapidly locate, classify and document 2D crystals using optical contrast, morphology and edge geometry.
02 / In Situ Metrology
Build the device.
Record the evidence.
Optical quality assurance, inside the assembly workflow.
Connect imaging, spectroscopy, and crystal-orientation measurements to the materials you select and the devices you build.
In situ optical QA
A build record
for every device.
01
Imaging
Bright-field · Dark-field
02
Characterisation
Photoluminescence · Differential reflectivity (absorption)
03
Orientation
Confocal Second Harmonic Generation (SHG) mapping available
Part of the build, not an afterthought
Assembly and metrology.
Connected.
Device quality is assessed during and after the build. Integrating optical QA into the instrument connects those observations to the crystal database and the assembly history.
For research teams and multi-user facilities, the result is a documented build rather than an isolated “hero” sample.
Imaging and Metrology Capabilities
Imaging and spectroscopy
in one workflow.
Multiple measurements. One quality record. No single measurement captures every aspect. We combine complementary imaging and spectroscopy to assess crystal morphology, defects, interface quality, and crystallographic orientation.
Dark-field imaging
Reveal features that are difficult to see in bright field, including bubbles, wrinkles, contamination, tears and other scattering defects that can compromise interface and device quality.
Wide-field photoluminescence
Rapidly map optical emission across semiconducting crystals and heterostructures, assess spatial uniformity, and flag regions where emission is quenched or modified by defects, interfaces or stacking.
Wide-field
differential reflectivity
Automatically identifies crystal thickness of any material at high precision using wavelength-dependent constructive and destructive interference modelling. The same spectra also reveal excitonic resonances, material identity, and optical quality.
Confocal SHG mapping
Automatic twist-angle recognition and armchair / zigzag edge detection connect crystal-orientation information to the assembly workflow.
Traceability
Every build has a history.
The platform connects crystal morphology and metadata, the intended stack, machine-vision assembly, and optical QA.
- 01
Starting crystals
Morphology and metadata
- 02
Device design
Selected layers and arrangement
- 03
Assembly
Machine-vision-controlled build
- 04
Optical QA
A record linked to the device
What do you need to measure?
Tell us about your material system, device requirements, and optical characterisation workflow.